Abstract
This TriMark Publications report deals primarily with the analysis of market segments of microscopes used in clinical and research laboratories. Emphasis is on the U.S. markets; however, the worldwide markets are analyzed and discussed as well. Specifically, this report examines those companies and products which are actively developing and marketing microscopy devices and supplies in market segments which have the potential for growth rates above 5% per year over the next five years. It continues to examine those microscopy devices operated as light, confocal, electron and scanning probe microscopes. Also analyzed are applications for certain microscope technology platforms such as semi-conductor processing systems and automated imaging systems. Concentration is centered on an overview of individual microscopy markets, which are believed to possess the elements that will lead to sustained growth rates for the foreseeable future. This report assesses the current status of each market, makes projections for market size, discusses the market strategies of leading companies in each market segment, and evaluates the forces that underlie the high growth of each segment. Additionally, there' s an overview of the instruments and supplies marketed by major companies in each market segment. Analysis of the market size, growth rates, and market components for instruments used for microscopy are also discussed.
Table of Contents
- 1 Overview
- 1.1 Statement of Report
- 1.2 Scope of This Report
- 1.3 Objectives
- 1.4 Methodology
- 1.5 Aims of This Report
- 1.6 Executive Summary
- 1.7 Trends and Conclusions
- 2 Introduction to Microscopy Markets
- 2.1 Overview of Microscopy Technologies
- 2.1.1 Introduction
- 2.1.2 Basic Optical Microscopy (OM)
- 2.1.3 Electron Microscopy (EM) and Other Charged-Particle Technologies
- 2.1.4 Advanced Optical Microscopy
- 2.1.5 Scanning Probe Microscopy (SPM)
- 2.1.6 Fourier Transform Infrared Microscopy (FT-IR)
- 2.1.7 Ultraviolet Microscopy (UVM)
- 2.1.8 Scanning Acoustic Microscopy (SAM)
- 2.1.9 X-Ray Microscopy / Microtomography (MCT, XMT, Micro-CT)
- 2.2 Market Perspective
- 2.3 Market Analysis
- 2.3.1 Market Size
- 2.3.2 Market Share
- 2.3.3 Key Players
- 2.3.4 Competition
- 2.3.5 Barriers to Growth
- 2.3.6 Market Drivers
- 2.4 Purchasers' Perspectives
- 2.1 Overview of Microscopy Technologies
- 3 In-Depth Discussion of Optical (Light) Microscopy (OM)
- 3.1 Lens Systems
- 3.2 Resolution
- 3.3 Illumination Systems
- 3.4 Innovations
- 3.4.1 Stereo Microscopes
- 3.5 Major Applications of Optical Microscopy
- 3.5.1 Semiconductor Manufacturing
- 3.5.2 Automated Medical Imaging
- 3.5.3 Market Drivers for Automated Systems for Semiconductor and Medical Applications
- 3.5.4 Real-Time Imaging
- 4 In-Depth Discussion of Light-Based Fluorescence, Multi-Photon and
Confocal Microscopy
- 4.1 Fluorescence Microscopy
- 4.2 Total Internal Reflection Fluorescence Microscopy (TIRFM)
- 4.3 Multi-Photon Microscopy
- 4.3.1 Basic Principles
- 4.3.2 Lasers
- 4.3.3 Fluorophores for Multi-Photon Work
- 4.3.4 Uncaging
- 4.3.5 Autofluorescence
- 4.4 Laser Scanning Confocal Microscopy (Confocal, LSCM)
- 4.4.1 Basic Principles
- 4.4.2 Confocal System Types
- 4.4.3 Photobleaching
- 4.5 High-Throughput Fluorescence and Confocal Imaging Systems
- 4.6 Major Players and Products in Optical, Fluorescence, Multi-Photon
and Confocal Microscopy
- 4.6.1 BD (Becton, Dickinson and Company)
- 4.6.2 KLA-Tencor Corporation
- 4.6.3 Korima, Inc.
- 4.6.4 Leica Microsystems, Inc.
- 4.6.5 Nikon Instruments, Inc.
- 4.6.6 Nanomics Imaging, Inc.
- 4.6.7 Olympus Imaging America, Inc.
- 4.6.8 Veeco Instruments, Inc.
- 4.6.9 Carl Zeiss Microimaging, Inc.
- 4.6.10 Modular Confocal Scanners
- 5 In-Depth Discussion of Scanning Probe Microscopy (SPM), Including
Near-Field (NSOM) and Atomic Force Microscopy (AFM)
- 5.1 Introduction
- 5.2 Near-Field Scanning Optical Microscopy (NSOM)
- 5.2.1 Resonance Frequency
- 5.2.2 Aperture
- 5.2.3 Reflection Mode
- 5.3 Near-Field Scanning Thermal Microscopy (NThM)
- 5.4 Atomic Force Microscopy (AFM)
- 5.4.1 Semiconductor Applications
- 5.4.2 Magnetic Material Applications
- 5.4.3 Electrochemical Applications
- 5.4.4 Life Sciences Applications
- 5.5 Major Players and Products in Scanning Probe Microscopy (Including
Near-Field and Atomic Force)
- 5.5.1 Agilent Technologies
- 5.5.2 Asylum Research
- 5.5.3 JEOL USA, Inc.
- 5.5.4 KLA-Tencor Corporation
- 5.5.5 Nanonics Imaging, Ltd.
- 5.5.6 Omicron NanoTechnology GmbH
- 5.5.7 Veeco Instruments, Inc.
- 5.5.8 WITec Instruments Corp.
- 6 In-Depth Discussion of Infrared and Ultraviolet Microscopy
- 6.1 Fourier-Transfer Infrared Microscopy (FT-IR)
- 6.2 Ultraviolet Microscopy (UVM)
- 6.3 Major Players and Products for Infrared and Ultraviolet Microscopy
- 6.3.1 Bruker Optics, Inc.
- 6.3.2 Craic Technologies
- 6.3.3 KLA-Tencor Corporation
- 6.3.4 Korima, Inc.
- 6.3.5 Thermo Scientific
- 7 In-Depth Discussion of Scanning Acoustic Microscopy, X-Ray
Microtomography and Raman Spectroscopic Microscopy
- 7.1 Scanning Acoustic Microscopy (SAM)
- 7.2 X-Ray Microtomography (CTM, Micro-CT)
- 7.3 Raman Spectroscopic Microscopy
- 8 Major Players and Products in Acoustic Microscopy, X-Ray Microtomography
and Raman Microscopy
- 8.1 Major Players in Acoustic Microscopy
- 8.1.1 Sonix, Inc.
- 8.1.2 Sonoscan, Inc.
- 8.2 Major Players in X-Ray Microtomography
- 8.2.1 Cameca Instruments, Inc.
- 8.2.2 SkyScan
- 8.3 Major Players in Raman Microscopy
- 8.3.1 Horiba Jobin Yvon, Inc.
- 8.3.2 Renishaw, Inc.
- 8.3.3 Thermo Scientific
- 8.1 Major Players in Acoustic Microscopy
- 9 In-Depth Discussion of Electron Microscopy (EM) and Related
Charged-Particle Systems
- 9.1 Transmission Electron Microscope (TEM)
- 9.1.1 Electron Sources
- 9.2 Scanning Electron Microscope (SEM)
- 9.2.1 Rastering
- 9.2.2 Exploring the Sample
- 9.2.3 Types of Image
- 9.2.4 Environmental SEM (ESEM) and Variable-Pressure SEM (VPSEM)
- 9.2.5 Low-Voltage SEM
- 9.2.6 Tabletop Models
- 9.2.7 Applications
- 9.3 Scanning/Transmission Electron Microscope (STEM)
- 9.4 Electron Probe Microanalyzer (EPMA, Microprobe)
- 9.5 Auger Electron Microscopy/Spectroscopy (AES, AEM, Auger)
- 9.6 Electron Beam (E-Beam) Lithography
- 9.7 Focused Ion Beam (FIB) and Dual-Beam Microscopes
- 9.8 Secondary Ion Mass Spectrometry (SIMS)
- 9.9 X-Ray Photoelectron Spectroscopy (XPS)/ Electron Spectroscopy for Chemical Analysis (ESCA)
- 9.10 Scanning Helium Ion Beam Microscopy (SHIM)
- 9.1 Transmission Electron Microscope (TEM)
- 10 Ancillary Analytical Attachments
- 10.1 Common/Historical Attachments
- 10.1.1 Energy-Dispersive (EDS) and Wavelength-Dispersive (WDS) X-ray Microanalyzers
- 10.1.2 Electron Backscatter Diffraction (EBSD)
- 10.1.3 Cathodoluminescence (CL)
- 10.1.4 X-Ray Microtomography
- 10.1.5 Raman Spectroscopy
- 10.1 Common/Historical Attachments
- 11 Major Players and Products in Electron Beam and Other Charged-Particle
Beam Microscopies
- 11.1 Cameca Instruments, Inc.
- 11.2 FEI Company
- 11.3 Hitachi High Technologies America, Inc.
- 11.4 JEOL USA, Inc.
- 11.5 KLA-Tencor Corporation
- 11.6 Omicron NanoTechnology GmbH
- 11.7 Vistec Lithography, Inc.
- 11.8 Carl Zeiss SMT Corporation
- 12 Company Profiles
- 12.1 Applied Materials, Inc.
- 12.2 Applied Precision, Inc.
- 12.3 Becton, Dickinson and Company
- 12.4 Bio-Rad Laboratories, Incorporated
- 12.5 Bruker Optics
- 12.6 Buehler
- 12.7 Cameca
- 12.8 Carl Zeiss, Inc.
- 12.9 Danish Micro Engineering A/S
- 12.10 FEI Company
- 12.11 Gatan
- 12.12 Genetix
- 12.13 Hitachi, Ltd.
- 12.14 Inami Corp.
- 12.15 IRIS International
- 12.16 JEOL
- 12.17 KLA-Tencor Corporation
- 12.18 Leica Microsystems (part of Danaher Corporation)
- 12.19 Medical Integrated Services (MIS)
- 12.20 Nanonics Imaging, Ltd.
- 12.21 Nikon, Inc.
- 12.22 NT-MDT
- 12.23 Obducat-CamScan
- 12.24 Olympus Corporation
- 12.25 Omicron Nanotechnology
- 12.26 Pacific Nanotechnology
- 12.27 Park Systems (formerly PSIA)
- 12.28 PerkinElmer
- 12.29 Quesant Instruments
- 12.30 Questar Corporation
- 12.31 Schott North America
- 12.32 Shimadzu Corporation
- 12.33 SII NanoTechnology
- 12.34 Thermo Fisher Scientific, Inc.
- 12.35 TM Microscopes (ThermoMicroscopes)
- 12.36 TriPath Imaging, Inc.
- 12.37 Veeco Instruments
- 12.38 WITec (Wissenschaftliche Instrumente und Technologie) GmbH
- 13 Company Directory
INDEX OF FIGURES
- Figure 2.1: Global Market for Microscopes, Accessories and Supplies, 2003-2012
- Figure 3.1: Basic Components of the Optical Microscope
- Figure 3.2: Stereo Microscope
INDEX OF TABLES
- Table 2.1: Global Market for Microscopes and Accessories, 2007-2013
- Table 2.2: Global Market for Optical Microscopes and Accessories
- Table 2.3: Global Market for Charged Particle Microscopes and Accessories
- Table 2.4: Global Market for Scanning Probe Microscopes and Accessories
- Table 3.1: Basic Components of the Optical Microscope
- Table 5.1: Types of Scanning Probe Microscopes
